soft errors

Noise analysis of soft errors in multiple output combinational logic systems

多输出组合逻辑系统中软故障的分析

Hardware failure and soft errors which were caused by human are two major threats to data security.

对数据安全的威胁主要有硬件的错误和人为因素导致的软错误。

They are based on extended Hamming Code and Cycle Redundancy Code, and designed to tolerant the soft errors happens in the links.

本文针对片上网络的链路上发生的软错误，利用扩展海明码和循环校验码，设计和实现了四种点到点的容错机制。

This paper describes main failure mechanism for MOS VLSI, Thin oxide breakdown, hot carrier effect, Al-Si contact failure, electromigration and soft errors. It gives out some technical measures to prevent above-mentioned failures.

本文论述了MOS VLSI主要失效机理，即薄氧化层击穿、热载流子效应、铝－硅接触失效、电迁移以及软错误，并给出了预防上述失效的一些技术措施。

In this paper, we propose a new methodology to analyze the soft errors in SRAM-based FPGAs.

本文中提出了一种新的方法，可以用来分析单粒子翻转对构建在FPGA上的系统造成的影响。

Although backup can deal with soft errors, we can not avoid data loss since backup always be done in period.

备份技术可以处理软错误，但是由于备份是周期性的，无法做到完全的数据无损失。

Because soft errors are not detectable directly by a server instance, a soft error could potentially cause a server instance to wait indefinitely.

由于软错误不能由服务器实例直接检测到，因此，可能导致服务器实例不确定地等待某个响应。